Search of a needle in Haystack : Analysis and reliability of nanoelectronic devices

Abstract

As the device technology is progressing from nanometer level towards atomic scale, the famous comment “There is plenty of room at the bottom” by Richard Feynman [1] 50 years ago needs to be studied carefully and understood in detail. This has to be viewed alongwith the comment by a leading device manufacturer “There is plenty of difficulty near the bottom” [2]. Why this discrepancy in observations?