Probe shape effect on near-field enhancement in apertureless terahertz near-field microscope

Abstract

We report on the experimental study of the probe shape dependency on terahertz near-field enhancement near the tip of a metallic probe in the apertureless terahertz scanning near-field microscope. It was established that terahertz near-field signal is strongly controlled by the cone shape of the probe and varies by an order of magnitude depending on the shape of the probe.