Mutation analysis and its industrial applications

Abstract

from EFSM specifications using numerous coverage criteria, which are evaluated using mutation analysis. The authors present their results, and provide recommendations for practitioners. 3. The third paper is Learning-based Mutant Reduction using Fine-grained Mutation Operators by Shin Hong and Yunho Kim . This paper proposes MUTRAIN, a technique for reducing the cost of mutation testing. It uses cost-considerate linear regression to learn a mutation model allows prediction of mutation score from a much smaller set of fine-grained mutation operators.