Structural and optical properties of Cd1−xZnxTe thick films with high zn concentrations

Abstract

Thick polycrystalline Cd1−xZnxTe films were deposited by the close spaced vacuum sublimation method. Study of structural and optical properties was carried out by X-ray diffraction, Raman spectroscopy, and low temperature photoluminescence. Obtained results allowed to estimate phase composition of the films, as well as to calculate the values of band gap of the films, which was 1.97 eV and 2.13 eV for samples with x=0.48 and x=0.65 respectively.