Evaluation of Leak Current and Charge Accumulation in Epoxy Resin at High Temperature Under High DC Stress

Kosuke Sato, N. Hashimoto, H. Miyake, Yasuhiro Tanaka
{"title":"Evaluation of Leak Current and Charge Accumulation in Epoxy Resin at High Temperature Under High DC Stress","authors":"Kosuke Sato, N. Hashimoto, H. Miyake, Yasuhiro Tanaka","doi":"10.1109/CEIDP50766.2021.9705371","DOIUrl":null,"url":null,"abstract":"In this paper, the leakage current and charge accumulation characteristics of epoxy resin at high temperature under high electric stress were investigated. Generally, ceramic materials are used for the insulating substrate of power modules, but they are being replaced by epoxy resin-based substrates to reduce cost and to improve a heat cycle resistance. In polymeric insulating materials such as epoxy resin, dielectric breakdown occurs due to increased leakage current and distortion of the internal electric field caused by the space charge accumulation when high DC voltage is applied for a long time at high temperature. Therefore, it is important to understand the leakage current characteristics and the space charge accumulation characteristics of insulating materials at high temperature under high electric field. In this study, the leakage current and the charge accumulation of two types of epoxy resins made with different curing agents were evaluated using a direct current integrated charge method (DCIC-Q(t)) at high temperature under high electric field. The results show epoxy resin with acid anhydride curing agents (EP-NH) has a better insulating performance than that with amine-based curing agents (EP-A).","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"67 1","pages":"81-84"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP50766.2021.9705371","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

In this paper, the leakage current and charge accumulation characteristics of epoxy resin at high temperature under high electric stress were investigated. Generally, ceramic materials are used for the insulating substrate of power modules, but they are being replaced by epoxy resin-based substrates to reduce cost and to improve a heat cycle resistance. In polymeric insulating materials such as epoxy resin, dielectric breakdown occurs due to increased leakage current and distortion of the internal electric field caused by the space charge accumulation when high DC voltage is applied for a long time at high temperature. Therefore, it is important to understand the leakage current characteristics and the space charge accumulation characteristics of insulating materials at high temperature under high electric field. In this study, the leakage current and the charge accumulation of two types of epoxy resins made with different curing agents were evaluated using a direct current integrated charge method (DCIC-Q(t)) at high temperature under high electric field. The results show epoxy resin with acid anhydride curing agents (EP-NH) has a better insulating performance than that with amine-based curing agents (EP-A).
高温高压下环氧树脂泄漏电流和电荷积累的研究
本文研究了高温下高电应力下环氧树脂的漏电流和电荷积累特性。一般来说,陶瓷材料用于功率模块的绝缘基板,但它们正在被环氧树脂基基板所取代,以降低成本和提高热循环性能。在环氧树脂等高分子绝缘材料中,在高温下长时间施加高直流电压时,由于泄漏电流增大和空间电荷积累引起的内部电场畸变而发生介电击穿。因此,了解绝缘材料在高温高电场作用下的漏电流特性和空间电荷积累特性具有重要意义。采用直流积分电荷法(DCIC-Q(t))对两种不同固化剂制备的环氧树脂在高温、高电场条件下的泄漏电流和电荷积累进行了研究。结果表明,添加酸酐固化剂(EP-NH)的环氧树脂比添加胺基固化剂(EP-A)的环氧树脂具有更好的绝缘性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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