{"title":"The volume fraction evolution in nanocrystallizing Al-Y-Ni-Fe alloy studied by means of electrical resistivity","authors":"P. Jaśkiewicz , K. Pȩkała , J. Latuch","doi":"10.1016/S0965-9773(99)00361-X","DOIUrl":null,"url":null,"abstract":"<div><p>The Al<sub>86</sub>Y<sub>5</sub>Ni<sub>5</sub>Fe<sub>4</sub><span><span><span> amorphous and partially nanocrystalline alloys were investigated by means of </span>differential scanning calorimetry<span> (DSC), temperature coefficient of resistivity<span> (TCR) and Transmission Electron Microscopy. The resistivity vs. temperature isochronal relation was used to calculate the transformed volume fraction, x(T), in the first stage of transformation. The comparison between these results and the DSC ones show that the TCR method is more correct for the </span></span></span>nanocrystallization process analysis.</span></p></div>","PeriodicalId":18878,"journal":{"name":"Nanostructured Materials","volume":"11 6","pages":"Pages 733-737"},"PeriodicalIF":0.0000,"publicationDate":"1999-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/S0965-9773(99)00361-X","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nanostructured Materials","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S096597739900361X","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The Al86Y5Ni5Fe4 amorphous and partially nanocrystalline alloys were investigated by means of differential scanning calorimetry (DSC), temperature coefficient of resistivity (TCR) and Transmission Electron Microscopy. The resistivity vs. temperature isochronal relation was used to calculate the transformed volume fraction, x(T), in the first stage of transformation. The comparison between these results and the DSC ones show that the TCR method is more correct for the nanocrystallization process analysis.