B. Verdonck, I. Bloch, H. Maître, D. Vandermeulen, P. Suetens
{"title":"Spiral CT: A Survey on Accuracy, Resolution and Artifacts","authors":"B. Verdonck, I. Bloch, H. Maître, D. Vandermeulen, P. Suetens","doi":"10.1007/S005290050002","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":87398,"journal":{"name":"EURASIP journal on applied signal processing","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1998-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"EURASIP journal on applied signal processing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/S005290050002","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}