Initial stages of the interaction of nitrous oxide and oxygen with the (100) silicon surface under low pressures

M.R. Baklanov, V.N. Kruchinin, S.M. Repinsky, A.A. Shklyaev
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引用次数: 10

Abstract

The kinetics of the interaction of oxygen and nitrous oxide with the (100) silicon surface within the temperature range 20–830°C has been studied. At temperatures between 20 and 600°C, irreversible supermonolayer gas chemisorption occurs. At temperatures between 700 and 830°C, the character of the interaction of N2O and O2 with the silicon surface is determined by the ratio of the oxidizer pressure and the surface temperature of the sample. This results in either etching of the sample surface with relief formation or growth of a silicon dioxide layer on the surface. Reversible adsorption of the oxidizer molecules on the initially formed oxide layer experimentally observed here for the first time plays a key role in the mechanism of SiO2 formation.

在低压下氧化亚氮和氧与(100)硅表面相互作用的初始阶段
研究了氧和氧化亚氮在20 ~ 830℃范围内与(100)硅表面相互作用的动力学。温度在20 ~ 600℃之间,发生不可逆的超单层气体化学吸附。在700 ~ 830℃的温度范围内,N2O和O2与硅表面的相互作用特性由氧化剂压力与样品表面温度的比值决定。这导致样品表面的蚀刻与浮雕形成或表面上二氧化硅层的生长。首次在实验中观察到氧化分子在初始形成的氧化层上的可逆吸附,在SiO2的形成机制中起着关键作用。
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