Effect of irradiation and annealing performed with bias voltage applied across the coupling capacitors on the interstrip resistance of ATLAS ITk silicon strip sensors

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment Pub Date : 2022-11-01 DOI:10.1016/j.nima.2022.167726

J. Kroll, P. Allport, A. Chisholm, V. Fadeyev, W. George, L. Gonella, I. Kopsalis, J. Kvasnička, V. Latonova, J. Lomas, F. Martinez-McKinney, M. Mikestikova, X. Shi, P. Tůma, M. Ullán, Y. Unno

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耦合电容上施加偏置电压辐照和退火对ATLAS ITk硅带传感器带间电阻的影响

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

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