THz Microscopy of Additive Manufactured Optical Components

Abstract

A THz microscope employs a superconducting Josephson cantilever as a sensor to visualize the spatial power distribution of high-frequency radiation above a sample. This setup can be used to investigate additive manufactured optical components. In this work, a far-infrared laser system is employed as a radiation source. The laser beam can be quasi-optically coupled into the vacuum chamber of the THz microscope. The interaction of the laser beam with additive manufactured components such as lenses is measured and subsequently three-dimensionally visualized.