{"title":"Colloidal particle sorting with scattering force via planar waveguide","authors":"M. Motosuke, Hideharu Kotari","doi":"10.1109/OMN.2013.6659091","DOIUrl":null,"url":null,"abstract":"This study investigates a potential of the optical scattering force as a practical particle sorting technology in a lab-on-a-chip platform. To avoid a tiny focused spot resulting in severe damage or heat generation in a polymer device, a 2D-focused irradiation with relatively low energy density to ensure the net retention distance was utilized. A SU-8 layer was used for a channel structure and planar waveguide for NIR laser beam. Our experimental results showed the effective particle transportation in the polymer chip instead of the irradiation of 2W beam that could easily damage the chip with the normally focused condition.","PeriodicalId":6334,"journal":{"name":"2013 International Conference on Optical MEMS and Nanophotonics (OMN)","volume":"10 1","pages":"125-126"},"PeriodicalIF":0.0000,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 International Conference on Optical MEMS and Nanophotonics (OMN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OMN.2013.6659091","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This study investigates a potential of the optical scattering force as a practical particle sorting technology in a lab-on-a-chip platform. To avoid a tiny focused spot resulting in severe damage or heat generation in a polymer device, a 2D-focused irradiation with relatively low energy density to ensure the net retention distance was utilized. A SU-8 layer was used for a channel structure and planar waveguide for NIR laser beam. Our experimental results showed the effective particle transportation in the polymer chip instead of the irradiation of 2W beam that could easily damage the chip with the normally focused condition.