{"title":"Effects of Electroplating Process Parameters on Properties of Co-electroplated Au-Sn alloy","authors":"Chunyan Lu, F. Huang, Mingliang L. Huang","doi":"10.1109/ICEPT47577.2019.245328","DOIUrl":null,"url":null,"abstract":"With the development of flip-chip packaging technology in high powered light-emitting diode (LED), the size of bump which plays a vital role to maintain the reliability of interconnects continues to decrease. Au-30at.%Sn eutectic alloy is one of the most promising lead-free solders, which has been widely used in LED packaging, owing to its excellent mechanical property and thermal conductivity. In the present work, a relatively stable non-cyanide electroplating solution was obtained. The co-electrodeposited films with bright silver surface and fine crystal grains were obtained, when the peak current density was between 25 mA/cm2 and 30 mA/cm2. Chronopotentiometry analysis indicated that the irregular and coarsened particles appeared under a relatively low current density. The optimal co-electroplating temperature of Au-Sn alloy was between 30 °C and 40 °C, at which the co- electrodeposited film has a nearly eutectic composition with a bright silver surface and fine crystal grains. The cathodic polarization curve showed the effect of different plating temperature on the co-deposition Au-Sn alloy. When the plating temperature was between 20 °C and 60 °C, the coelectrodeposition of Au-Sn alloy were occurred at -797 mV.","PeriodicalId":6676,"journal":{"name":"2019 20th International Conference on Electronic Packaging Technology(ICEPT)","volume":"6 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 20th International Conference on Electronic Packaging Technology(ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT47577.2019.245328","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
With the development of flip-chip packaging technology in high powered light-emitting diode (LED), the size of bump which plays a vital role to maintain the reliability of interconnects continues to decrease. Au-30at.%Sn eutectic alloy is one of the most promising lead-free solders, which has been widely used in LED packaging, owing to its excellent mechanical property and thermal conductivity. In the present work, a relatively stable non-cyanide electroplating solution was obtained. The co-electrodeposited films with bright silver surface and fine crystal grains were obtained, when the peak current density was between 25 mA/cm2 and 30 mA/cm2. Chronopotentiometry analysis indicated that the irregular and coarsened particles appeared under a relatively low current density. The optimal co-electroplating temperature of Au-Sn alloy was between 30 °C and 40 °C, at which the co- electrodeposited film has a nearly eutectic composition with a bright silver surface and fine crystal grains. The cathodic polarization curve showed the effect of different plating temperature on the co-deposition Au-Sn alloy. When the plating temperature was between 20 °C and 60 °C, the coelectrodeposition of Au-Sn alloy were occurred at -797 mV.