Analysis techniques for obtaining the steady-state solution of MOS LC oscillators

Abstract

Accurate analysis techniques for estimating the periodic steady-state solution of MOS LC oscillators using short-channel device equations are presented. These techniques allow us to make quantitative estimates of the oscillator steady-state performance without the need for time-consuming transient simulations using simulators such as SPICE. Further, our engineering techniques provide insight and quantitative understanding on the design of current-day, deep-submicron MOS LC oscillators and serve as a starting point in a design methodology that includes complete phase noise/timing jitter analysis and optimization. Our analytical results for a cross-coupled LC oscillator that was previously fabricated and tested are in good agreement with SPICE simulations.