Optical properties of ultrathin plasmonic TiN films

D. Shah, H. Reddy, N. Kinsey, V. Shalaev, A. Boltasseva
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引用次数: 1

Abstract

Epitaxial, ultrathin (<10 nm) plasmonic TiN films are characterized using spectroscopic ellipsometry and Hall measurements. Thin films with thicknesses down to 2 nm remain highly metallic with a carrier concentration on the order of 1022 cm−3.
超薄等离子体TiN薄膜的光学特性
外延,超薄(22 cm−3)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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