{"title":"Segmentation and classification of THCs on PCBAs","authors":"Daniel Herchenbach, Wei Li, Matthias Breier","doi":"10.1109/INDIN.2013.6622858","DOIUrl":null,"url":null,"abstract":"The dramatic increase of electronic waste requires automatic recycling, including technologies from machine vision. A framework for segmentation and classification of THC (through-hole components) mounted on PCBAs is presented, using both RGB and depth frames from the Kinect sensor by Microsoft. A segmentation approach, combining local and global features in a flexible manner, is shown to optimize a freely definable cost function globally. We interleave segmentation and classification as we form the final components using a simple, yet robust shape model.","PeriodicalId":6312,"journal":{"name":"2013 11th IEEE International Conference on Industrial Informatics (INDIN)","volume":"2015 1","pages":"59-64"},"PeriodicalIF":0.0000,"publicationDate":"2013-07-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 11th IEEE International Conference on Industrial Informatics (INDIN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INDIN.2013.6622858","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13
Abstract
The dramatic increase of electronic waste requires automatic recycling, including technologies from machine vision. A framework for segmentation and classification of THC (through-hole components) mounted on PCBAs is presented, using both RGB and depth frames from the Kinect sensor by Microsoft. A segmentation approach, combining local and global features in a flexible manner, is shown to optimize a freely definable cost function globally. We interleave segmentation and classification as we form the final components using a simple, yet robust shape model.