Thin films of II–VI compounds and alloys

T.L. Chu, S.S. Chu, C. Ferekides, J. Britt, C.Q. Wu, G. Chen, N. Schultz
{"title":"Thin films of II–VI compounds and alloys","authors":"T.L. Chu,&nbsp;S.S. Chu,&nbsp;C. Ferekides,&nbsp;J. Britt,&nbsp;C.Q. Wu,&nbsp;G. Chen,&nbsp;N. Schultz","doi":"10.1016/0379-6787(91)90044-P","DOIUrl":null,"url":null,"abstract":"<div><p>II–VI semiconductors and their alloys are promising thin film photovoltaic materials. Polycrystalline films of cadmium telluride (CdTe), zinc telluride (ZnTe), cadmium zinc telluride (<span><math><mtext>Cd</mtext><msub><mi></mi><mn>x</mn></msub><mtext>Zn</mtext><msub><mi></mi><mn>1−x</mn></msub><mtext>Te</mtext></math></span>), and mercury zinc telluride (<span><math><mtext>Hg</mtext><msub><mi></mi><mn>x</mn></msub><mtext>Zn</mtext><msub><mi></mi><mn>1−x</mn></msub><mtext>Te</mtext></math></span>) were deposited onto glass and transparent-conducting-semiconductor (TCS) coated glass substrates by metal-organic chemical vapor deposition. Emphasis was directed to the doping of CdTe films, ohmic contacts to p-CdTe, and thin film CdTe homojunctions. CdTe films may be doped intrinsically or extrinsically; gallium and arsenic were used as the extrinsic n and p dopant respectively. p<sup>+</sup>-ZnTe films deposited <em>in situ</em> were used as an ohmic contact to p-CdTe films. Thin film CdTe homojunctions were prepared by the successive <em>in situ</em> deposition of n-CdTe, p-CdTe, and p<sup>+</sup>-ZnTe films on SnO<sub>2</sub>-coated glass substrates, and their properties were investigated. The properties of <span><math><mtext>Cd</mtext><msub><mi></mi><mn>x</mn></msub><mtext>Zn</mtext><msub><mi></mi><mn>1−x</mn></msub><mtext>Te</mtext></math></span> and <span><math><mtext>Hg</mtext><msub><mi></mi><mn>x</mn></msub><mtext>Zn</mtext><msub><mi></mi><mn>1−x</mn></msub><mtext>Te</mtext></math></span> films with band gap energy in the range 1.65–1.75 eV deposited onto glass and TCS-coated glass substrates were studied.</p></div>","PeriodicalId":101172,"journal":{"name":"Solar Cells","volume":"30 1","pages":"Pages 123-130"},"PeriodicalIF":0.0000,"publicationDate":"1991-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0379-6787(91)90044-P","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Solar Cells","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/037967879190044P","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16

Abstract

II–VI semiconductors and their alloys are promising thin film photovoltaic materials. Polycrystalline films of cadmium telluride (CdTe), zinc telluride (ZnTe), cadmium zinc telluride (CdxZn1−xTe), and mercury zinc telluride (HgxZn1−xTe) were deposited onto glass and transparent-conducting-semiconductor (TCS) coated glass substrates by metal-organic chemical vapor deposition. Emphasis was directed to the doping of CdTe films, ohmic contacts to p-CdTe, and thin film CdTe homojunctions. CdTe films may be doped intrinsically or extrinsically; gallium and arsenic were used as the extrinsic n and p dopant respectively. p+-ZnTe films deposited in situ were used as an ohmic contact to p-CdTe films. Thin film CdTe homojunctions were prepared by the successive in situ deposition of n-CdTe, p-CdTe, and p+-ZnTe films on SnO2-coated glass substrates, and their properties were investigated. The properties of CdxZn1−xTe and HgxZn1−xTe films with band gap energy in the range 1.65–1.75 eV deposited onto glass and TCS-coated glass substrates were studied.

II-VI类化合物和合金薄膜
II-VI半导体及其合金是很有前途的薄膜光伏材料。采用金属有机化学气相沉积方法在玻璃和透明导电半导体(TCS)镀膜玻璃衬底上沉积了碲化镉(CdTe)、碲化锌(ZnTe)、碲化镉锌(CdxZn1−xTe)和碲化汞锌(HgxZn1−xTe)多晶薄膜。重点是CdTe薄膜的掺杂,p-CdTe的欧姆接触和薄膜CdTe的同质结。CdTe薄膜可以内在或外在掺杂;镓和砷分别作为外源掺杂剂。原位沉积的p+-ZnTe薄膜作为p- cdte薄膜的欧姆接触。在sno2镀膜玻璃基底上连续原位沉积n-CdTe、p-CdTe和p+-ZnTe薄膜,制备了CdTe薄膜同质结,并对其性能进行了研究。研究了带隙能在1.65 ~ 1.75 eV范围内的CdxZn1−xTe和HgxZn1−xTe薄膜在玻璃和tcs涂层玻璃衬底上的沉积性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信