PEAXIS: A RIXS and XPS Endstation for Solid-State Quantum and Energy Materials at BESSY II

Deniz P. Wong, C. Schulz, M. Bartkowiak
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引用次数: 0

Abstract

PEAXIS (Photo Electron Analysis and resonant X-ray Inelastic Spectroscopy) is a dedicated endstation installed at the beamline U41-PEAXIS that offers high resolution soft X-ray spectroscopy measurements with incident photon energies ranging from 180 – 1600 eV. The endstation combines two X-ray spectroscopic techniques, X-ray photoelectron spectroscopy (XPS) and resonant inelastic soft X-ray scattering (RIXS), which are important for probing the electronic structure and local and collective excitations of solid-state materials. It features a continuous variation of scattering angle under UHV conditions for wave vector-resolved studies and a modular sample environment that allows investigation in the temperature range between 10 K and 1000 K.
BESSY II固态量子和能量材料的RIXS和XPS终端站
PEAXIS(光电子分析和共振x射线非弹性光谱)是安装在光束线U41-PEAXIS上的专用终端站,提供高分辨率软x射线光谱测量,入射光子能量范围为180 - 1600 eV。该终端结合了两种x射线光谱技术,即x射线光电子能谱(XPS)和共振非弹性软x射线散射(RIXS),这两种技术对于探测固态材料的电子结构和局部和集体激发具有重要意义。它的特点是在特高压条件下散射角的连续变化,用于波矢量解析研究和模块化样品环境,允许在10 K到1000 K的温度范围内进行研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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