A 298-fJ/writecycle 650-fJ/readcycle 8T three-port SRAM in 28-nm FD-SOI process technology for image processor

Haruki Mori, Tomoki Nakagawa, Yuki Kitahara, Y. Kawamoto, Kenta Takagi, S. Yoshimoto, S. Izumi, K. Nii, H. Kawaguchi, M. Yoshimoto
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引用次数: 7

Abstract

This paper presents a low-power and low-voltage 64-kb 8T three-port image memory using a 28-nm FD-SOI process technology. Our proposed SRAM accommodates eight-transistor bitcells comprising one-write/two-read ports and a majority logic circuit to save active energy. The test chip can operate at a supply voltage of 0.46 V and an access time of 140 ns. The energy minimum point is a supply voltage of 0.54 V and an access time of 55 ns (= 18.2 MHz), at which 298 fJ/cycle in a write operation and 650 fJ/cycle in a read operation are achieved with the help of the majority logic; these factor are 87% and 52% smaller than those in a 28-nm FD-SOI 6T SRAM.
一种采用28nm FD-SOI工艺技术的8T三端口SRAM,其写周期为298-fJ/读周期为650-fJ/读周期
本文提出了一种采用28纳米FD-SOI工艺技术的低功耗、低电压64kb 8T三端口图像存储器。我们提出的SRAM容纳八个晶体管位单元,包括一个写/两个读端口和一个多数逻辑电路,以节省有源能量。测试芯片可以在0.46 V的电源电压和140 ns的访问时间下工作。能量最小点是电源电压为0.54 V,访问时间为55 ns (= 18.2 MHz),此时多数逻辑可实现写入操作298 fJ/周期和读取操作650 fJ/周期;这两个因子分别比28纳米FD-SOI 6T SRAM小87%和52%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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