{"title":"Back reflector texture and stability issues in high efficiency multijunction amorphous silicon alloy solar cells","authors":"A. Banerjee, K. Hoffman, X. Xu, J. Yang, S. Guha","doi":"10.1109/WCPEC.1994.520017","DOIUrl":null,"url":null,"abstract":"The role of the back reflector texture on the initial and stabilized efficiency of high efficiency triple-junction triple-bandgap amorphous silicon alloy based cells has been investigated. The devices have been deposited on Ag/ZnO back reflector possessing three different textures. The performance of the bottom single-junction a-SiGe alloy n-i-p cell on the three textures has also been analyzed. The value of the short-circuit current density of the n-i-p cell initially increases and then decreases with increasing texture. Light soaking results show that the higher textures exhibit superior device stability. Degradation as low as 8% has been obtained on the triple-junction cells.","PeriodicalId":20517,"journal":{"name":"Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1994-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WCPEC.1994.520017","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
The role of the back reflector texture on the initial and stabilized efficiency of high efficiency triple-junction triple-bandgap amorphous silicon alloy based cells has been investigated. The devices have been deposited on Ag/ZnO back reflector possessing three different textures. The performance of the bottom single-junction a-SiGe alloy n-i-p cell on the three textures has also been analyzed. The value of the short-circuit current density of the n-i-p cell initially increases and then decreases with increasing texture. Light soaking results show that the higher textures exhibit superior device stability. Degradation as low as 8% has been obtained on the triple-junction cells.