Identifying implementation bugs in machine learning based image classifiers using metamorphic testing

Anurag Dwarakanath, Manish Ahuja, Samarth Sikand, Raghotham M. Rao, Jagadeesh Chandra J. C. Bose, Neville Dubash, Sanjay Podder
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引用次数: 144

Abstract

We have recently witnessed tremendous success of Machine Learning (ML) in practical applications. Computer vision, speech recognition and language translation have all seen a near human level performance. We expect, in the near future, most business applications will have some form of ML. However, testing such applications is extremely challenging and would be very expensive if we follow today's methodologies. In this work, we present an articulation of the challenges in testing ML based applications. We then present our solution approach, based on the concept of Metamorphic Testing, which aims to identify implementation bugs in ML based image classifiers. We have developed metamorphic relations for an application based on Support Vector Machine and a Deep Learning based application. Empirical validation showed that our approach was able to catch 71% of the implementation bugs in the ML applications.
使用变形测试识别基于机器学习的图像分类器中的实现错误
最近,我们见证了机器学习(ML)在实际应用中的巨大成功。计算机视觉、语音识别和语言翻译的表现都接近人类的水平。我们预计,在不久的将来,大多数商业应用程序将具有某种形式的机器学习。然而,如果我们遵循今天的方法,测试这样的应用程序是极具挑战性的,并且将非常昂贵。在这项工作中,我们提出了测试基于ML的应用程序所面临的挑战。然后,我们提出了基于变形测试概念的解决方案,旨在识别基于ML的图像分类器中的实现错误。我们开发了一个基于支持向量机的应用程序和一个基于深度学习的应用程序的变质关系。经验验证表明,我们的方法能够捕获ML应用程序中71%的实现错误。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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