Hydrophobic Properties of CuO Thin Films Obtained by Sol-Gel Spin Coating Technique-Annealing Temperature Effect

A. Bougharouat, N. Touka, Dalila Talbi, K. Baddari
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引用次数: 2

Abstract

The adhesive characteristics of sol-gel copper oxide (CuO) film surfaces at annealing temperatures ranging from 350 to 550°C were examined in this work. Hydrophobic properties of these oxide film surfaces were studied by contact angle measurements. The surface energy was calculated from contact angle data using harmonic mean method. The structural, morphological and chemical analysis of the samples were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and Fourier transform infrared (FTIR). The increase in annealing temperature induces a reduction in the hydrophilic properties of the films (adhesive properties). The rise in the hydrophobicity of the CuO surface has been claimed to be explained by a change in interfacial tension. The FTIR spectroscopy analysis revealed that the increase in the annealing temperature eliminates activated neutral species (hydroxyl groups) reacting with the surface of the sample responsible for the wettability. SEM analysis showed that the morphology of the samples is nanostructured containing agglomerates of various forms, a few hundred nanometers in size, randomly dispersed across the surface. The enhanced roughness of the produced film is primarily responsible for the increased hydrophobicity of the films. The XRD data reveal that the films are highly textured and that increasing the annealing temperature induces better layer crystallization and confirms the development of copper oxide CuO.
溶胶-凝胶自旋镀膜技术制备CuO薄膜的疏水性-退火温度效应
本文研究了溶胶-凝胶型氧化铜(CuO)薄膜表面在350 ~ 550℃退火温度下的粘附特性。通过接触角测量研究了这些氧化膜表面的疏水性。根据接触角数据,采用谐波平均法计算表面能。采用x射线衍射(XRD)、扫描电镜(SEM)和傅里叶变换红外(FTIR)对样品进行了结构、形态和化学分析。退火温度的升高引起薄膜亲水性(粘接性能)的降低。CuO表面疏水性的提高可以用界面张力的变化来解释。FTIR光谱分析表明,退火温度的升高消除了与样品表面反应的活化中性物质(羟基),这些物质负责润湿性。扫描电镜分析表明,样品的形貌为纳米结构,含有各种形式的团聚体,大小为几百纳米,随机分布在表面。所制备的膜的粗糙度增强是膜疏水性增强的主要原因。XRD结果表明,薄膜织构良好,退火温度的升高有利于层析结晶,证实了氧化铜CuO的发育。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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