System-level modeling of energy in TLM for early validation of power and thermal management

Tayeb Bouhadiba, M. Moy, F. Maraninchi
{"title":"System-level modeling of energy in TLM for early validation of power and thermal management","authors":"Tayeb Bouhadiba, M. Moy, F. Maraninchi","doi":"10.7873/DATE.2013.327","DOIUrl":null,"url":null,"abstract":"Modern systems-on-a-chip are equipped with power architectures, allowing to control the consumption of individual components or subsystems. These mechanisms are controlled by a power-management policy often implemented in the embedded software, with hardware support. Today's circuits have an important static power consumption, whose low-power design require techniques like DVFS or power-gating. A correct and efficient management of these mechanisms is therefore becoming non-trivial. Validating the effect of the power management policy needs to be done very early in the design cycle, as part of the architecture exploration activity. High-level models of the hardware must be annotated with consumption information. Temperature must also be taken into account since leakage current increases exponentially with it. Existing annotation techniques applied to loosely-timed or temporally-decoupled models would create bad simulation artifacts on the temperature profile (e.g. unrealistic peaks). This paper addresses the instrumentation of a timed transaction-level model of the hardware with information on the power consumption of the individual components. It can cope not only with power-state models, but also with Joule-per-bit traffic models, and avoids simulation artifacts when used in a functional/power/temperature co-simulation.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"16 1","pages":"1609-1614"},"PeriodicalIF":0.0000,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"37","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.7873/DATE.2013.327","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 37

Abstract

Modern systems-on-a-chip are equipped with power architectures, allowing to control the consumption of individual components or subsystems. These mechanisms are controlled by a power-management policy often implemented in the embedded software, with hardware support. Today's circuits have an important static power consumption, whose low-power design require techniques like DVFS or power-gating. A correct and efficient management of these mechanisms is therefore becoming non-trivial. Validating the effect of the power management policy needs to be done very early in the design cycle, as part of the architecture exploration activity. High-level models of the hardware must be annotated with consumption information. Temperature must also be taken into account since leakage current increases exponentially with it. Existing annotation techniques applied to loosely-timed or temporally-decoupled models would create bad simulation artifacts on the temperature profile (e.g. unrealistic peaks). This paper addresses the instrumentation of a timed transaction-level model of the hardware with information on the power consumption of the individual components. It can cope not only with power-state models, but also with Joule-per-bit traffic models, and avoids simulation artifacts when used in a functional/power/temperature co-simulation.
TLM中的系统级能量建模,用于功率和热管理的早期验证
现代片上系统配备了电源架构,允许控制单个组件或子系统的消耗。这些机制由电源管理策略控制,通常在嵌入式软件中实现,并具有硬件支持。当今的电路具有重要的静态功耗,其低功耗设计需要DVFS或功率门控等技术。因此,正确和有效地管理这些机制变得非常重要。验证电源管理策略的效果需要在设计周期的早期完成,作为架构探索活动的一部分。硬件的高级模型必须用消费信息进行注释。温度也必须考虑在内,因为漏电流随温度呈指数增长。应用于松散时间或时间解耦模型的现有注释技术将在温度剖面上创建糟糕的模拟工件(例如不切实际的峰值)。本文讨论了硬件的定时事务级模型的检测,其中包含有关各个组件功耗的信息。它不仅可以处理功率状态模型,还可以处理每比特焦耳流量模型,并且在功能/功率/温度联合仿真中使用时避免了仿真工件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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