Hydrogen Concentration-Induced Stresses in an Environmental TEM

M. Connolly, Veruska Malavé, May L. Martin
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引用次数: 1

Abstract

The Hydrogen Enhanced Localized Plasticity (HELP) mechanism is a leading candidate among proposed Hydrogen Embrittlement (HE) mechanisms. Transmission Electron Microscopy (TEM) measurements of an increased dislocation mobility upon exposure to hydrogen provide the most direct evidence for the HELP mechanism. However, the electron beam in TEM microscopes can dissociate hydrogen, leading to a hydrogen fugacity much greater than the applied pressure. Such high fugacity will generate a large concentration gradient between the surface and interior of a TEM sample. It has been proposed that the observed dislocation mobility is due only to concentration-gradient stresses rather than an effect of the interaction with hydrogen. Here we calculate the expected stresses for H/Fe system to be an order of magnitude too low to impact dislocation mobility, and we show that the concentration gradient-induced stresses dissipate quickly in both H/Fe and H/Ni systems - well before observation by TEM would occur.
环境瞬变电磁法中氢浓度诱导的应力
氢增强局部塑性(HELP)机制是氢脆(HE)机制中的主要候选机制。透射电子显微镜(TEM)测量了暴露于氢后位错迁移率的增加,为HELP机制提供了最直接的证据。然而,电子显微镜中的电子束可以解离氢,导致氢的逸出度远远大于施加的压力。如此高的逸度会在TEM样品的表面和内部产生很大的浓度梯度。有人提出,观察到的位错迁移率仅是由于浓度梯度应力而不是与氢相互作用的影响。在这里,我们计算出H/Fe体系的预期应力低到一个数量级,不足以影响位错迁移率,并且我们表明,在H/Fe和H/Ni体系中,浓度梯度引起的应力在TEM观察之前就迅速消散了。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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