{"title":"Remote embedded devices test framework on the cloud","authors":"Il-Seok Choi, C. Jeong","doi":"10.1002/stvr.1768","DOIUrl":null,"url":null,"abstract":"Embedded systems have high coupling and dependency among different hardware and software components in heterogeneous layers, which makes location and issue tracking in their testing difficult. Despite these poor verification conditions, even the most important reliability quality verification among embedded system characteristics is verified with insufficient sample size, typical test cases, and general test strategies, following limitations such as development costs and scheduling. As a result, shipments are highly likely to lead to various reliability quality problems because items have not been verified considering reliability quality characteristics. Hence, to address this gap, this study developed remote embedded device test framework on the cloud (RED‐TFC), which has an innovative reliability test manager component that can automatically perform various tests for the evaluation of reliability and performance of distributed shared devices by utilizing the cloud concept. RED‐TFC offers two key enhancements over existing testing services: (i) the adaptive sample scale for reliability test (ASRT), a feature that identifies the most appropriate sample size for performing functionality and reliability tests of remote verification targets connected to the RED‐TFC server; and (ii) the mass sample reliability test (MSRT), which uses a test case that is specific to reliability, with the sample size obtained by ASRT, to perform verification following the Markov prediction process. This paper analyses two Android smartphone models considered the most generic examples, including many embedded components, and presents a method of detecting a high number of reliability problems in smartphones using the proposed RED‐TFC and its implications.","PeriodicalId":49506,"journal":{"name":"Software Testing Verification & Reliability","volume":"14 1","pages":""},"PeriodicalIF":1.5000,"publicationDate":"2021-03-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Software Testing Verification & Reliability","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1002/stvr.1768","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, SOFTWARE ENGINEERING","Score":null,"Total":0}
引用次数: 0
Abstract
Embedded systems have high coupling and dependency among different hardware and software components in heterogeneous layers, which makes location and issue tracking in their testing difficult. Despite these poor verification conditions, even the most important reliability quality verification among embedded system characteristics is verified with insufficient sample size, typical test cases, and general test strategies, following limitations such as development costs and scheduling. As a result, shipments are highly likely to lead to various reliability quality problems because items have not been verified considering reliability quality characteristics. Hence, to address this gap, this study developed remote embedded device test framework on the cloud (RED‐TFC), which has an innovative reliability test manager component that can automatically perform various tests for the evaluation of reliability and performance of distributed shared devices by utilizing the cloud concept. RED‐TFC offers two key enhancements over existing testing services: (i) the adaptive sample scale for reliability test (ASRT), a feature that identifies the most appropriate sample size for performing functionality and reliability tests of remote verification targets connected to the RED‐TFC server; and (ii) the mass sample reliability test (MSRT), which uses a test case that is specific to reliability, with the sample size obtained by ASRT, to perform verification following the Markov prediction process. This paper analyses two Android smartphone models considered the most generic examples, including many embedded components, and presents a method of detecting a high number of reliability problems in smartphones using the proposed RED‐TFC and its implications.
期刊介绍:
The journal is the premier outlet for research results on the subjects of testing, verification and reliability. Readers will find useful research on issues pertaining to building better software and evaluating it.
The journal is unique in its emphasis on theoretical foundations and applications to real-world software development. The balance of theory, empirical work, and practical applications provide readers with better techniques for testing, verifying and improving the reliability of software.
The journal targets researchers, practitioners, educators and students that have a vested interest in results generated by high-quality testing, verification and reliability modeling and evaluation of software. Topics of special interest include, but are not limited to:
-New criteria for software testing and verification
-Application of existing software testing and verification techniques to new types of software, including web applications, web services, embedded software, aspect-oriented software, and software architectures
-Model based testing
-Formal verification techniques such as model-checking
-Comparison of testing and verification techniques
-Measurement of and metrics for testing, verification and reliability
-Industrial experience with cutting edge techniques
-Descriptions and evaluations of commercial and open-source software testing tools
-Reliability modeling, measurement and application
-Testing and verification of software security
-Automated test data generation
-Process issues and methods
-Non-functional testing