An Efficient Procedure For The Synthesis Of Fast Self-testable Controller Structures

S. Hellebrand, H. Wunderlich
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引用次数: 12

Abstract

The BIST implementation of a conventionally synthesized controller in most cases requires the integration of an additional register only for test purposes. This leads to some serious drawbacks concerning the fault coverage, the system speed and the area overhead. A synthesis technique is presented which uses the additional test register also to implement the system function by supporting self-testable pipeline-like controller structures. It will be shown, that if the need of two different registers in the final structure is already taken into account during synthesis, then the overall number of flipflops can be reduced, and the fault coverage and system speed can be enhanced. The presented algorithm constructs realizations of a given finite state machine specification which can be trivially implemented by a self-testable structure. The efficiency of the procedure is ensured by a very precise characterization of the space of suitable realizations, which avoids the computational overhead of previously published algorithms.
一种快速自测试控制器结构的有效合成方法
在大多数情况下,常规合成控制器的BIST实现只需要为测试目的集成额外的寄存器。这在故障覆盖、系统速度和区域开销方面导致了一些严重的缺陷。提出了一种利用附加测试寄存器的综合技术,通过支持自测试的类流水线控制器结构来实现系统功能。结果表明,如果在综合时考虑到最终结构中需要两个不同的寄存器,则可以减少触发器的总数,提高故障覆盖率和系统速度。该算法构造了给定有限状态机规范的实现,可以通过自测试结构轻松实现。通过非常精确地描述合适实现的空间,确保了该过程的效率,从而避免了先前发布的算法的计算开销。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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