Tian Li, T. Taniguchi, Y. Shiota, T. Moriyama, T. Ono
{"title":"Chromatic Aberration Effect in Refraction of Spin Waves","authors":"Tian Li, T. Taniguchi, Y. Shiota, T. Moriyama, T. Ono","doi":"10.3379/msjmag.2011l003","DOIUrl":null,"url":null,"abstract":"We numerically investigated the refraction property of spin waves (SWs) at thickness step in films with out-ofplane magnetization, in which the SWs propagate isotropically in the film plane. It was confirmed the isotropic SWs were refracted at a thickness step by following the Snell's law. We also found that the refraction angle of SWs of the dipole-exchange mode depends on the resonant frequency, indicating that the chromatic aberration effect should be taken into account in designing magnonic devices.","PeriodicalId":36791,"journal":{"name":"Journal of the Magnetics Society of Japan","volume":"3 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of the Magnetics Society of Japan","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3379/msjmag.2011l003","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 0
Abstract
We numerically investigated the refraction property of spin waves (SWs) at thickness step in films with out-ofplane magnetization, in which the SWs propagate isotropically in the film plane. It was confirmed the isotropic SWs were refracted at a thickness step by following the Snell's law. We also found that the refraction angle of SWs of the dipole-exchange mode depends on the resonant frequency, indicating that the chromatic aberration effect should be taken into account in designing magnonic devices.