{"title":"Power consumption improvement with residue code for fault tolerance on SRAM FPGA","authors":"F. Amiel, T. Ea, Vashishtha Vinay","doi":"10.1109/DASIP.2011.6136883","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":6494,"journal":{"name":"2016 Conference on Design and Architectures for Signal and Image Processing (DASIP)","volume":"9 1","pages":"223-228"},"PeriodicalIF":0.0000,"publicationDate":"2011-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Conference on Design and Architectures for Signal and Image Processing (DASIP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DASIP.2011.6136883","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}