A. Bonci, M. Pirani, A. Dragoni, A. Cucchiarelli, S. Longhi
{"title":"The relational model: In search for lean and mean CPS technology","authors":"A. Bonci, M. Pirani, A. Dragoni, A. Cucchiarelli, S. Longhi","doi":"10.1109/INDIN.2017.8104758","DOIUrl":null,"url":null,"abstract":"The complexity of cyber-physical systems (CPSs) poses new challenges in their design, model checking and maintenance. The hardware and software designers are in search, more than ever, for simple and interoperable approaches that render the complexity of CPSs a treatable matter. In this work, database language is suggested as an enabling technology and a lean technique to the purpose. An example with best available embedded database technology is conducted by means of a deployment test on tiny embedded electronics.","PeriodicalId":6595,"journal":{"name":"2017 IEEE 15th International Conference on Industrial Informatics (INDIN)","volume":"70 1","pages":"127-132"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE 15th International Conference on Industrial Informatics (INDIN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INDIN.2017.8104758","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13
Abstract
The complexity of cyber-physical systems (CPSs) poses new challenges in their design, model checking and maintenance. The hardware and software designers are in search, more than ever, for simple and interoperable approaches that render the complexity of CPSs a treatable matter. In this work, database language is suggested as an enabling technology and a lean technique to the purpose. An example with best available embedded database technology is conducted by means of a deployment test on tiny embedded electronics.