Effect of low-temperature electrode baking on breakdown in vacuum

Abstract

Effects of electrode baking at a comparatively low temperature in vacuum have been examined. The temperature of the electrode is controlled well below the melting point of organic insulators, if installed. Currents accompanied by the microdischarges and the conditioning process during breakdown test are observed. It is shown that low temperature baking effectively suppresses the microdischarge, and that baking of the anode is more effective than baking of the cathode. It is also shown that baking reduces the number of voltage applications which are necessary for the spark conditioning. >