Modeling the inversion charge centroid in Tri-Gate MOSFETs including quantum effects

Abstract

In this paper, inversion charge centroid analytical model for Tri-Gate (TG) metal-oxide- semiconductor field effect transistors (MOSFETs) considering quantum effects is presented. To obtain the QM effects of TG MOSFETs, the coupled Poisson and Schrodinger equations are solved using variational approach. This model is developed to provide an analytical expression for inversion charge distribution function (ICDF). The obtained ICDF is used to calculate the inversion charge centroid.