S.A. Hussien, P. Colter, A. Dip, J.R. Gong, M.U. Erdogan, S.M. Bedair
{"title":"Materials aspects of multijunction solar cells","authors":"S.A. Hussien, P. Colter, A. Dip, J.R. Gong, M.U. Erdogan, S.M. Bedair","doi":"10.1016/0379-6787(91)90063-U","DOIUrl":null,"url":null,"abstract":"<div><p>Atomic layer epitaxy (ALE) was used to grow several components of the cascade solar cell structure in the AlGaAs/GaAs system. An ALE reactor was constructed for multiwafer growth with a growth rate of 0.6 μm h<sup>−1</sup>. Device quality GaAs and <span><math><mtext>As</mtext><msub><mi></mi><mn>x</mn></msub><mtext>Ga</mtext><msub><mi></mi><mn>1−x</mn></msub><mtext>As</mtext></math></span> films were grown with p-type background carbon doping in the ranges 10<sup>15</sup>–10<sup>19</sup> cm<sup>−3</sup> and 10<sup>16</sup>–10<sup>20</sup> cm<sup>−3</sup> respectively. N-type films were achieved by SiH<sub>4</sub> doping, producing carrier concentrations in the range 10<sup>16</sup>–10<sup>18</sup> cm<sup>−3</sup>. In addition, the potential applications of the ALE technique in the photovoltaic field are discussed.</p></div>","PeriodicalId":101172,"journal":{"name":"Solar Cells","volume":"30 1","pages":"Pages 305-311"},"PeriodicalIF":0.0000,"publicationDate":"1991-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0379-6787(91)90063-U","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Solar Cells","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/037967879190063U","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Atomic layer epitaxy (ALE) was used to grow several components of the cascade solar cell structure in the AlGaAs/GaAs system. An ALE reactor was constructed for multiwafer growth with a growth rate of 0.6 μm h−1. Device quality GaAs and films were grown with p-type background carbon doping in the ranges 1015–1019 cm−3 and 1016–1020 cm−3 respectively. N-type films were achieved by SiH4 doping, producing carrier concentrations in the range 1016–1018 cm−3. In addition, the potential applications of the ALE technique in the photovoltaic field are discussed.