New sensing application to diagnose power semiconductor aging in actuator power drive systems

Abstract

This paper presents a new sensing application to diagnose power semiconductor aging in power drive systems. It has been shown previously that device parasitic characteristics change during the aging process which results in detectable changes in their frequency response. This change is manifested in the current signal at very high frequencies. Therefore, using a wideband AC current sensor, high frequency components of the current can be acquired, providing a way to detect device aging.