B. Kumari, Santhosh Pandranki, Manodipan Sahoo, Rohit Sharma
{"title":"Copper-MWCNT Composite: A Solution to Breakdown in Copper Interconnects","authors":"B. Kumari, Santhosh Pandranki, Manodipan Sahoo, Rohit Sharma","doi":"10.1109/NANO51122.2021.9514276","DOIUrl":null,"url":null,"abstract":"In this work, Cu-MWCNT composite is recommended as a potential solution to diminish breakdown in copper interconnects caused due to self- heating. Cu-MWCNT composite is less affected by temperature variation as compared to copper interconnect by 33%. To support this deduction, lateral temperature profiles of copper and Cu-MWCNT composite are compared which shows that copper interconnect reaches a higher temperature point due to self-heating as compared to Cu-MWCNT composite interconnect. Delay in Cu-MWCNT composite interconnect turned out to be lesser than copper interconnect. Also, increase in the fraction of MWCNT in Cu-MWCNT composite ($F_{MWCNT}$) leads to decrease in delay. Cu-MWCNT composite with higher $F_{MWCNT}$ experiences lesser Noise Delay Product (NDP) among all the alternatives which makes it most advantageous in terms of signal integrity. NDP of Cu-MWCNT composite interconnects are almost constant with increase in temperature making it immune to thermal effects. MWCNT has the highest reliability in terms of breakdown power ($P_{BD}$) while 1 mm long Cu-MWCNT composite (with $F_{MWCNT}=0.6$) when compared to copper has 61% improvement in breakdown power. Cu-MWCNT composite interconnect is much better than copper interconnect specially for longer wire and higher $F_{MWCNT}$ in terms of $NDP/P_{BD}$ ratio. Our analysis recommends long Cu-MWCNT composite (with $F_{MWCNT}> 0.6$) interconnects to replace copper interconnects as a solution to increased self-heating in copper leading to its breakdown and also improvement in signal integrity aspects.","PeriodicalId":6791,"journal":{"name":"2021 IEEE 21st International Conference on Nanotechnology (NANO)","volume":"36 1","pages":"122-125"},"PeriodicalIF":0.0000,"publicationDate":"2021-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 21st International Conference on Nanotechnology (NANO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NANO51122.2021.9514276","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this work, Cu-MWCNT composite is recommended as a potential solution to diminish breakdown in copper interconnects caused due to self- heating. Cu-MWCNT composite is less affected by temperature variation as compared to copper interconnect by 33%. To support this deduction, lateral temperature profiles of copper and Cu-MWCNT composite are compared which shows that copper interconnect reaches a higher temperature point due to self-heating as compared to Cu-MWCNT composite interconnect. Delay in Cu-MWCNT composite interconnect turned out to be lesser than copper interconnect. Also, increase in the fraction of MWCNT in Cu-MWCNT composite ($F_{MWCNT}$) leads to decrease in delay. Cu-MWCNT composite with higher $F_{MWCNT}$ experiences lesser Noise Delay Product (NDP) among all the alternatives which makes it most advantageous in terms of signal integrity. NDP of Cu-MWCNT composite interconnects are almost constant with increase in temperature making it immune to thermal effects. MWCNT has the highest reliability in terms of breakdown power ($P_{BD}$) while 1 mm long Cu-MWCNT composite (with $F_{MWCNT}=0.6$) when compared to copper has 61% improvement in breakdown power. Cu-MWCNT composite interconnect is much better than copper interconnect specially for longer wire and higher $F_{MWCNT}$ in terms of $NDP/P_{BD}$ ratio. Our analysis recommends long Cu-MWCNT composite (with $F_{MWCNT}> 0.6$) interconnects to replace copper interconnects as a solution to increased self-heating in copper leading to its breakdown and also improvement in signal integrity aspects.