Three Port Non-Linear Characterization of Power Amplifiers under Modulated Excitations Using a Vector Network Analyzer Platform

Abstract

This paper presents a novel single-instrument solution for combined characterization of power amplifiers (PAs) at radiofrequency (RF) and baseband. It extends the capabilities of a commercial vector network analyzer (VNA) platform by enabling calibrated and synchronized RF envelope and baseband current/voltage measurements on the supply terminal of the amplifier across several MHz of bandwidth. As an application example, full three-port measurements of a 2-W gallium nitride (GaN) PA are reported.