Experimental and simulative investigations of conducted EMI performance of IGBTs for 5-10 kVA converters

Abstract

Power switches with high dv/dt and di/dt rates like IGBTs are the source of EMI. The paper presents investigations of conducted EMI on IGBTs in different test circuits. Moreover, results are explained from a special developed model for prediction of common and differential mode interferences, that is suitable to determine solutions for a better EMC through other design around the semiconductor chip. Results and further possibilities are discussed.