Towards mm-wave nanoelectronics and RF switches using MoS2 2D Semiconductor

Myungsoo Kim, Saungeun Park, A. Sanne, S. Banerjee, D. Akinwande
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引用次数: 6

Abstract

In this paper, we report state-of-the-art large area CVD monolayer MoS2-based RF transistors and RF switches. An embedded gate structure was used to fabricate short channel CVD Mos2Rf FETs with an intrinsic fT of 20 GHz, intrinsic $\mathbf{f}_{\mathbf{max}}$ of 11.4 GHz, and the high-field saturation velocity Vsat of $\mathbf{1.88}\times \mathbf{10}^{\mathbf{6}}\ \mathbf{cm}/\mathbf{s}$. The gate-first process allows for enhancement mode operation, $\mathbf{I}_{\mathbf{ON}}/\mathbf{I}_{\mathbf{OFF}}$ ratio of $\mathbf{10}^{\mathbf{8}}$, and a transconductance $(\mathbf{g}_{\mathbf{m}})$ of 70 $\pmb{\mu} \mathbf{S}/\pmb{\mu}\mathbf{m}$. Also, we use a vertical MIM structure for a RF switch based on CVD Mos2. The device was programmed with a voltage as low as 1 V, and achieves an ON-state resistance of $\sim \mathbf{5}\ \pmb{\Omega}$ and an OFF-state capacitance of ~6 fF. We measured and simulated the RF performance of the device up to 50 GHz and report 0.5 dB insertion loss, 15 dB isolation (both at 50 GHz), and 5 THz cutoff frequency.
利用二硫化钼二维半导体开发毫米波纳米电子学和射频开关
在本文中,我们报告了最先进的大面积CVD单层mos2射频晶体管和射频开关。采用嵌入式栅极结构制备了短沟道CVD Mos2Rf场效应管,其本特性fT为20 GHz,本特性$\mathbf{f}_{\mathbf{max}}$为11.4 GHz,高场饱和速度Vsat为$\mathbf{1.88}\times \mathbf{10}^{\mathbf{6}}\ \mathbf{cm}/\mathbf{s}$。栅极优先工艺允许增强模式操作,$\mathbf{I}_{\mathbf{ON}}/\mathbf{I}_{\mathbf{OFF}}$比为$\mathbf{10}^{\mathbf{8}}$,跨导$(\mathbf{g}_{\mathbf{m}})$为70 $\pmb{\mu} \mathbf{S}/\pmb{\mu}\mathbf{m}$。此外,我们在基于CVD Mos2的射频开关中使用了垂直MIM结构。该器件被编程为低至1 V的电压,并实现了导通状态电阻$\sim \mathbf{5}\ \pmb{\Omega}$和关断状态电容6ff。我们测量并模拟了器件高达50 GHz的射频性能,并报告了0.5 dB插入损耗、15 dB隔离(均为50 GHz)和5 THz截止频率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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