Imaging the crystal structure of few-layer two-dimensional crystals by optical nonlinearity

L. Malard, T. V. Alencar, A. P. Barboza, K. Mak, A. M. de Paula
{"title":"Imaging the crystal structure of few-layer two-dimensional crystals by optical nonlinearity","authors":"L. Malard, T. V. Alencar, A. P. Barboza, K. Mak, A. M. de Paula","doi":"10.1364/CLEO_AT.2013.JW2A.05","DOIUrl":null,"url":null,"abstract":"We report the observation of second harmonic generation (SHG) from odd-layer MoS2 atomic crystal. In contrast, no SHG is observed for samples with even layer numbers due to the restoration of perfect inversion symmetry. Moreover, the SHG intensity is found to directly reflect the underlying 3-fold rotation symmetry of the crystal, which provides a powerful method for optical imaging of the material crystal structure with sub-micron resolution.","PeriodicalId":10254,"journal":{"name":"CLEO: 2013","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2013-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"CLEO: 2013","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/CLEO_AT.2013.JW2A.05","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

We report the observation of second harmonic generation (SHG) from odd-layer MoS2 atomic crystal. In contrast, no SHG is observed for samples with even layer numbers due to the restoration of perfect inversion symmetry. Moreover, the SHG intensity is found to directly reflect the underlying 3-fold rotation symmetry of the crystal, which provides a powerful method for optical imaging of the material crystal structure with sub-micron resolution.
利用光学非线性技术对二维少层晶体结构进行成像
本文报道了从MoS2奇层原子晶体中观察到的二次谐波产生。相反,由于恢复了完美的反演对称性,偶层数的样品没有观察到SHG。此外,发现SHG强度直接反映了晶体的三重旋转对称性,这为亚微米分辨率的材料晶体结构光学成像提供了有力的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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