C. Delhom, E. Hequet, Brendan R. Kelly, N. Abidi, V. Martin
{"title":"Calibration of HVI cotton elongation measurements","authors":"C. Delhom, E. Hequet, Brendan R. Kelly, N. Abidi, V. Martin","doi":"10.1186/s42397-020-00073-1","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2020-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s42397-020-00073-1","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"99","ListUrlMain":"https://doi.org/10.1186/s42397-020-00073-1","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 4
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
