Hongzhang Zhu, Chuanping Wu, Yang Zhou, Yao Xie, Tiannian Zhou
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引用次数: 0
Abstract
This paper proposes a feature extraction method combining adaptive variational mode decomposition (AVMD) and singular value decomposition (SVD) for electric shock fault-type identification. The AVMD algorithm is utilized to adaptively decompose the electric shock signal into intrinsic mode components, each containing distinct frequency information. Subsequently, the correlation coefficient is employed to extract the intrinsic mode component with amplitudes greater than or equal to 0.1 ( ≥ 0.1). Feature extraction is then performed using SVD on the ≥ 0.1 intrinsic mode component, based on its maximum singular value and singular entropy. This approach effectively overcomes the limitation of the traditional VMD that necessitates manual K value setting. Moreover, it achieves dimensionality reduction and feature extraction of the intrinsic mode components through SVD, resulting in enhanced computational efficiency and fault identification accuracy. Extensive simulations demonstrate the remarkable recognition rates of electric shock fault types in animals and plants using the proposed AVMD-SVD method, achieving a recognition rate as high as 99.25%. Comparative performance analysis further verifies the superiority of AVMD-SVD over similar empirical mode decomposition-SVD feature extraction techniques.
期刊介绍:
IET Science, Measurement & Technology publishes papers in science, engineering and technology underpinning electronic and electrical engineering, nanotechnology and medical instrumentation.The emphasis of the journal is on theory, simulation methodologies and measurement techniques.
The major themes of the journal are:
- electromagnetism including electromagnetic theory, computational electromagnetics and EMC
- properties and applications of dielectric, magnetic, magneto-optic, piezoelectric materials down to the nanometre scale
- measurement and instrumentation including sensors, actuators, medical instrumentation, fundamentals of measurement including measurement standards, uncertainty, dissemination and calibration
Applications are welcome for illustrative purposes but the novelty and originality should focus on the proposed new methods.