A near-DC measurement and modelling of low-frequency noise in electronic components

IF 1.4 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Zeinab Shamaee, Mohsen Mivehchy, Iraj Kazemi
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引用次数: 0

Abstract

Low-frequency noise, generated inherently by the number or mobility fluctuation of carriers, is a crucial concern for the design of analog and digital circuits. Unified modelling based on experimental validation of near-DC noise in amplifiers is a long-standing open problem. This article develops a model for low-frequency noise by deriving new bounds for carrier capturing and releasing. According to the proposed model, a measurement system is suggested that operates in a wide frequency range and even at very low frequencies. The system is noise-tolerant, since the amplifier is selected based on acceptable noise levels. Among the advantages are the independence from specialized structural noise models for each component and the low cost of the measurement system. The evaluation results show that the proposed method leads to a promising improvement in the low-frequency noise measuring and is superior to conventional models in the normalized root mean square error indicator. Findings reveal that the proposed measurement method can estimate the flicker noise around the DC frequency, and the proposed model agrees reasonably with the proposed measurement circuit.

Abstract Image

电子元件低频噪声的近直流测量与建模
低频噪声本质上是由载波的数量或迁移率波动产生的,是模拟和数字电路设计中的一个关键问题。基于放大器中近直流噪声实验验证的统一建模是一个长期存在的悬而未决的问题。本文通过推导载波捕获和释放的新边界,建立了低频噪声的模型。根据所提出的模型,提出了一种在宽频率范围内甚至在非常低的频率下工作的测量系统。由于放大器是根据可接受的噪声水平来选择的,因此该系统具有噪声耐受性。优点之一是每个部件独立于专门的结构噪声模型,并且测量系统的成本低。评估结果表明,该方法在低频噪声测量方面有很大的改进,在归一化均方根误差指标方面优于传统模型。研究结果表明,所提出的测量方法可以估计直流频率附近的闪烁噪声,并且所提出的模型与所提出的测试电路合理一致。
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来源期刊
Iet Science Measurement & Technology
Iet Science Measurement & Technology 工程技术-工程:电子与电气
CiteScore
4.30
自引率
7.10%
发文量
41
审稿时长
7.5 months
期刊介绍: IET Science, Measurement & Technology publishes papers in science, engineering and technology underpinning electronic and electrical engineering, nanotechnology and medical instrumentation.The emphasis of the journal is on theory, simulation methodologies and measurement techniques. The major themes of the journal are: - electromagnetism including electromagnetic theory, computational electromagnetics and EMC - properties and applications of dielectric, magnetic, magneto-optic, piezoelectric materials down to the nanometre scale - measurement and instrumentation including sensors, actuators, medical instrumentation, fundamentals of measurement including measurement standards, uncertainty, dissemination and calibration Applications are welcome for illustrative purposes but the novelty and originality should focus on the proposed new methods.
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