An Improvement in the Reliability of Standard Cell Enclosures

Abstract

We describe the design of a new temperature-regulation circuit, which is used as an outer oven controller for new standard cell enclosures, with the emphasis on improving the reliability of the temperature control. A redundant protection circuit is used to prevent loss of temperature control caused by component failures in the controller. The temperature control of the outer oven of the enclosure is better than 0.4 mK per °C change in ambient temperature. When used with the additional inner controller the sensitivity of the cell temperature to the ambient temperature is improved to 20 μK/°C. This paper describes in detail the new circuit, summarizes the enclosure construction, and presents data on the performance of the system.