Transferring Accuracy to the Trace Level and Then to the Field

Paul De Biévre
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引用次数: 1

Abstract

[5] Piccone, T. J., Butrymowicz, D. B., Newbury, D. E., Mannig, J. R., and Cahn, J. W., Scripta Met., 839 (1982). [6] Myklebust, R. L., Newbury, D. E., Marinenko, R. B., and Bright, D. S., Background Correction in Electron Microprobe Compositional Mapping with Wavelength-Dispersive X-ray Spectrometry, Microbeam Analysis, San Francisco Press (1987) 25. [7] Garruto, R. M., Swyt, C., Fiori, C. E., Yanagihara, R., and Gajdusek, D. D., Lancet, 1353 (1985).
将精度转移到跟踪级,然后转移到现场
[5] Piccone,T.J.、Butrymowicz,D.B.、Newbury,D.E.、Mannig,J.R.和Cahn,J.W.,Scripta Met。,839(1982)。[6] Myklebust,R.L.、Newbury,D.E.、Marinenko,R.B.和Bright,D.S.,利用波长色散X射线光谱法进行电子微探针成分图的背景校正,微束分析,旧金山出版社(1987)25。[7] Garruto,R.M.、Swyt,C.、Fiori,C.E.、Yanagihara,R.和Gajdusek,D.,《柳叶刀》,1353(1985)。
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