{"title":"Transferring Accuracy to the Trace Level and Then to the Field","authors":"Paul De Biévre","doi":"10.6028/jres.093.142","DOIUrl":null,"url":null,"abstract":"[5] Piccone, T. J., Butrymowicz, D. B., Newbury, D. E., Mannig, J. R., and Cahn, J. W., Scripta Met., 839 (1982). [6] Myklebust, R. L., Newbury, D. E., Marinenko, R. B., and Bright, D. S., Background Correction in Electron Microprobe Compositional Mapping with Wavelength-Dispersive X-ray Spectrometry, Microbeam Analysis, San Francisco Press (1987) 25. [7] Garruto, R. M., Swyt, C., Fiori, C. E., Yanagihara, R., and Gajdusek, D. D., Lancet, 1353 (1985).","PeriodicalId":17082,"journal":{"name":"Journal of research of the National Bureau of Standards","volume":"40 1","pages":"520 - 525"},"PeriodicalIF":0.0000,"publicationDate":"1988-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of research of the National Bureau of Standards","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.6028/jres.093.142","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
[5] Piccone, T. J., Butrymowicz, D. B., Newbury, D. E., Mannig, J. R., and Cahn, J. W., Scripta Met., 839 (1982). [6] Myklebust, R. L., Newbury, D. E., Marinenko, R. B., and Bright, D. S., Background Correction in Electron Microprobe Compositional Mapping with Wavelength-Dispersive X-ray Spectrometry, Microbeam Analysis, San Francisco Press (1987) 25. [7] Garruto, R. M., Swyt, C., Fiori, C. E., Yanagihara, R., and Gajdusek, D. D., Lancet, 1353 (1985).