A. Knöchel, M. Bavdaz, N. Gurker, P. Ketelsen, W. Petersen, M. Salehi, T. Dietrich
{"title":"Synchrotron Radiation Excited Fluorescence Micro-Analysis Using a New Imaging Technique","authors":"A. Knöchel, M. Bavdaz, N. Gurker, P. Ketelsen, W. Petersen, M. Salehi, T. Dietrich","doi":"10.6028/jres.093.085","DOIUrl":null,"url":null,"abstract":"[I] Levi-Setti, R., Wang, Y. L., and Crow, G., Appl. Surf. Sci. 26, 249 (1986). [2] Levi-Setti, R., Chabala, J., and Wang, Y. L., Scanning Micros. Suppl. 1, 13 (1987). [3] Wang, Y. L., Levi-Setti, R., and Chabala, J., Scanning Microsc. 1 (1987). [41 Williams, D. B., Levi-Setti, R., Chabala, J. M., and Newbury, D. E., J. Microsc. (1987) in press. [51 Williams, D. B., Levi-Setti, R., Chabala, J. M., and Newbury, D. E., to be submitted to J. Microsc. [6] Chabala, J. M., Levi-Setti, R., Bradley, S. A., and Karasek, K. R., Imaging Microanalysis of Silicon Nitride Ceramics with a High Resolution Scanning Ion Microprobe. Appl. Surf. Sci. (1987) in press.","PeriodicalId":17082,"journal":{"name":"Journal of research of the National Bureau of Standards","volume":"93 1","pages":"379 - 383"},"PeriodicalIF":0.0000,"publicationDate":"1988-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of research of the National Bureau of Standards","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.6028/jres.093.085","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
[I] Levi-Setti, R., Wang, Y. L., and Crow, G., Appl. Surf. Sci. 26, 249 (1986). [2] Levi-Setti, R., Chabala, J., and Wang, Y. L., Scanning Micros. Suppl. 1, 13 (1987). [3] Wang, Y. L., Levi-Setti, R., and Chabala, J., Scanning Microsc. 1 (1987). [41 Williams, D. B., Levi-Setti, R., Chabala, J. M., and Newbury, D. E., J. Microsc. (1987) in press. [51 Williams, D. B., Levi-Setti, R., Chabala, J. M., and Newbury, D. E., to be submitted to J. Microsc. [6] Chabala, J. M., Levi-Setti, R., Bradley, S. A., and Karasek, K. R., Imaging Microanalysis of Silicon Nitride Ceramics with a High Resolution Scanning Ion Microprobe. Appl. Surf. Sci. (1987) in press.
[I] Levi Setti,R.,Wang,Y.L.和Crow,G.,Appl。冲浪科学。26249(1986)。[2] Levi Setti,R.,Chabala,J.和王,Y.L.,扫描显微镜。增刊1,13(1987)。[3] 王,李维·塞蒂,R.,查巴拉,J.,扫描显微镜。1(1987)。[41 Williams,D.B.,Levi-Setti,R.,Chabala,J.M.和Newbury,D.E.,J.Microsc.(1987)出版。[51 Williams,D.B.,Levi Setti,R..,Chabal,J.M.,和Newburi,D.E.提交给J.Microsc.[6]Chabala、J.M.、Levi-Setti,R.、Bradley,S.A.和Karasek,K.R.,使用高分辨率扫描离子探针对氮化硅陶瓷进行成像微分析。Appl。冲浪科学。(1987)出版。