Accuracy in Microanalysis by Electron Energy-Loss Spectroscopy

Abstract

[I] Williams, D. B., Practical Analytical Electron Microscopy in Materials Science, Philips Electron Optics Publishing Group, Mahwah, NJ (1984). [2] Joy, D. c., Romig, A. D., and Goldstein, 1. I., Principles of Analytical Electron Microscopy, Plenum Press, New York (1986). [3] Goldstein, J. I., Newbury, D. E., Echlin, P., Joy, D. C., Fiori, C. E., and Lifshin, E., Scanning Electron Microscopy and X-ray Microanalysis, Plenum Press, New York (1981) p. 435. [4] Liebhafshy, H. A., Pfeiffer, H. G., and Zemany, P. D., X-ray Microscopy and X-ray Microanalysis, Elsevier/ North Holland, Amsterdam (1960) p. 321. [5] Cliff, G., and Lorimer, G. W., J. Microsc. (U.K.) 103, 203 (1975). [6] Michael, J. R., M.S. Thesis, Lehigh University (1981) p.41. [7] Romig, A. D., and Goldstein, J. I., Detectability Limits and Spatial Resolution in STEM X-ray Analysis: Application to Fe-Ni Alloys, Microbeam Analysis1979, San Francisco Press (1979) p. 124. [8] Lyman, C. E., Microanalysis Limits on the Use of Energy Dispersive X-ray Spectroscopy in the Analytical Electron Microscope, Microbeam Analysis-1986, San Francisco Press (1986) p. 434. [9] Lyman, C. E., and Michael, J. R., A Sensitivity Test for Energy Dispersive X-ray Spectrometry in the Analytical Electron Microscope, Analytical Electron Microscopy1987, San Francisco Press (1987) in press. rIO] Williams, D. B., Towards the Limits of Microanalysis in the Analytical Electron Microscope, Electron Microscopy and Analysis-1987, The Institute of Physics (1987) in press. [II] Ziebold, T. 0., Anal. Chern. 36, 322 (1967). [121 Williams, D. B., Standardized Definitions of X-ray Analysis Performance Criteria in the AEM, Microbeam Analysis-1986, San Francisco Press (1986) p. 443. [13] Williams, D. B., and Steel, E. B., A Standard Cr Thin Film Specimen to Measure the X-ray Peak to Background Ratio (Using the Fiori Definition) in Analytical Electron Microscopes, Analytical Electron Microscopy-1987, San Francisco Press (1987) in press. [14] Fiori, C. E., Swyt, C. R., arid Ellis, J. R., The Theoretical Characteristic to Continuum Ratio in Energy Dispersive Analysis in the Analytical Electron Microscope, Microbeam Analysis-1982, San Francisco Press (1982) p. 57. [IS] Vale, S. H., and Statham, P. J., STEM Image Stabilization for High Resolution Microanalysis, Proc. XIth Int. Congo on Electron Microscopy, Kyoto 1986, Japanese Society of Electron Microscopy, Tokyo (1986) p. 573.