Three-Dimensional X-Ray Diffraction Technique for Metals Science

Q3 Energy

中国材料进展 Pub Date : 2017-01-01 DOI:10.7502/J.ISSN.1674-3962.2017.03.04

Yubin Zhang, G. Fan

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引用次数: 0

Abstract

Thethree-dimensionalX-raydifraction(3DXRD)isanew,advancedtechniqueformaterialscharacterization.This techniqueutilizeshigh-energysynchrotronX-raystocharacterizethe3Dcrystalographicstructureandstrain/stressstateofbulk materials.Asthemeasurementisnon-destructive,themicrostructuralevolutionasafunctionoftimecanbefolowed,ieit alows4D(x,y,zcharacterizations,t).ThehighbrilianceofsynchrotronX-raysensuresthatdifractionsignalsfrom volumesofmicrometerscalecanbequicklydetectedanddistinguishedfromthebackgroundnoise,ieitsspatialresolutioncan bemicrometerscaleandthemeasurementcanbeconductedwithinareasonabletimeframe(afewhours).The3DXRD microscopehasoriginalybeendevelopedincooperationbetweenformerRisNationalLaboratoryandtheEuropeanSynchrotron RadiationFacility.Curently,thistechniquehasbeenimplementedinseverallargesynchrotronfacilities,egtheAdvanced PhotonSource(APS)inUSAandtheSpring-8inJapan.Anotherfamilyof3DXRDtechniquethatutilizeswhitebeam synchrotronX-rayshasalsobeendevelopedinparalelincooperationbetweenOakRidgeNationalLaboratoryandAPS.This articlereviewsthe3DXRDtechnique.Thecontentincludestheideabehindthetechnique,theprincipleandspecification (spatial,angular,temporalresolutionsandsampleenvironmentetc)ofthetechnique.Severalapplicationsofthetechniquesin metalurgyaregiven,including:grain-scaledstressanalysisduringtensiledeformation,recrystalizationgrowthkinetics, recrystalizationnucleation,growthofindividualrecrystalizedgrain,graingrowthafterrecrystalization,andlocalresidualstrain/ stressanalysis.Therecentdevelopmentofthe3DXRDtechniqueanditspotentialuseformaterialsscienceinthefuturewilbe brieflydiscussedattheend.

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金属科学三维x射线衍射技术

Thethree-dimensionalX-raydifraction (3 dxrd) isanew advancedtechniqueformaterialscharacterization。该技术利用高能同步x射线来表征块状材料的三维晶体结构和应变/应力状态。Asthemeasurementisnon-destructive, themicrostructuralevolutionasafunctionoftimecanbefolowede它alows4D (x, y, zcharacterizations t)。同步x射线传感器的高亮度意味着可以快速检测到微米级体积的衍射信号并与背景噪声区分开来，它的空间分辨率可以达到微米级，并且可以在合理的时间范围内(几小时)进行测量。3d xrd显微镜最初是由英国国家实验室和欧洲同步辐射设施合作开发的。现thistechniquehasbeenimplementedinseverallargesynchrotronfacilities eg先进PhotonSource inUSAandtheSpring-8inJapan (APS)。Anotherfamilyof3DXRDtechniquethatutilizeswhitebeam synchrotronX-rayshasalsobeendevelopedinparalelincooperationbetweenOakRidgeNationalLaboratoryandAPS。这articlereviewsthe3DXRDtechnique。Thecontentincludestheideabehindthetechnique theprincipleandspecification(空间、角、temporalresolutionsandsampleenvironmentetc)ofthetechnique。给出了该技术在冶金中的几个应用，包括:拉伸变形过程中的晶粒尺度应力分析、再结晶生长动力学、再结晶成核、个别再结晶晶粒的生长、再结晶后的晶粒生长和局部残余应变/应力分析。Therecentdevelopmentofthe3DXRDtechniqueanditspotentialuseformaterialsscienceinthefuturewilbe brieflydiscussedattheend。

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来源期刊

中国材料进展 Energy-Nuclear Energy and Engineering

CiteScore

1.00

自引率

0.00%

发文量

4229

期刊介绍：