{"title":"Local Tuning of the Surface Potential in Silicon Carriers by Ion Beam Induced Intrinsic Defects","authors":"D. Blaschke, L. Rebohle, I. Skorupa, H. Schmidt","doi":"10.4236/ampc.2022.1211019","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":68199,"journal":{"name":"材料物理与化学进展(英文)","volume":"1 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"材料物理与化学进展(英文)","FirstCategoryId":"1087","ListUrlMain":"https://doi.org/10.4236/ampc.2022.1211019","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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