P. Paul, Anur Dhungel, Maisha Sadia, Md Razuan Hossain, Md. Sakib Hasan
{"title":"Self-Parameterized Chaotic Map for Low-Cost Robust Chaos","authors":"P. Paul, Anur Dhungel, Maisha Sadia, Md Razuan Hossain, Md. Sakib Hasan","doi":"10.3390/jlpea13010018","DOIUrl":null,"url":null,"abstract":"This paper presents a general method, called “self-parameterization”, for designing one-dimensional (1-D) chaotic maps that provide wider chaotic regions compared to existing 1-D maps. A wide chaotic region is a desirable property, as it helps to provide robust performance by enlarging the design space in many hardware-security applications, including reconfigurable logic and encryption. The proposed self-parameterization scheme uses only one existing chaotic map, referred to as the seed map, and a simple transformation block. The effective control parameter of the seed map is treated as an intermediate variable derived from the input and control parameter of the self-parameterized map, under some constraints, to achieve the desired functionality. The widening of the chaotic region after adding self-parameterization is first demonstrated on three ideal map functions: Logistic; Tent; and Sine. A digitized version of the scheme was developed and realized in a field-programmable gate array (FPGA) implementation. An analog version of the proposed scheme was developed with very low transistor-count analog topologies for hardware-constrained integrated circuit (IC) implementation. The chaotic performance of both digital and analog implementations was evaluated with bifurcation plots and four established chaotic entropy metrics: the Lyapunov Exponent; the Correlation Coefficient; the Correlation Dimension; and Approximate Entropy. An application of the proposed scheme was demonstrated in a random number generator design, and the statistical randomness of the generated sequence was verified with the NIST test.","PeriodicalId":38100,"journal":{"name":"Journal of Low Power Electronics and Applications","volume":"1 1","pages":""},"PeriodicalIF":1.6000,"publicationDate":"2023-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Low Power Electronics and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3390/jlpea13010018","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 2
Abstract
This paper presents a general method, called “self-parameterization”, for designing one-dimensional (1-D) chaotic maps that provide wider chaotic regions compared to existing 1-D maps. A wide chaotic region is a desirable property, as it helps to provide robust performance by enlarging the design space in many hardware-security applications, including reconfigurable logic and encryption. The proposed self-parameterization scheme uses only one existing chaotic map, referred to as the seed map, and a simple transformation block. The effective control parameter of the seed map is treated as an intermediate variable derived from the input and control parameter of the self-parameterized map, under some constraints, to achieve the desired functionality. The widening of the chaotic region after adding self-parameterization is first demonstrated on three ideal map functions: Logistic; Tent; and Sine. A digitized version of the scheme was developed and realized in a field-programmable gate array (FPGA) implementation. An analog version of the proposed scheme was developed with very low transistor-count analog topologies for hardware-constrained integrated circuit (IC) implementation. The chaotic performance of both digital and analog implementations was evaluated with bifurcation plots and four established chaotic entropy metrics: the Lyapunov Exponent; the Correlation Coefficient; the Correlation Dimension; and Approximate Entropy. An application of the proposed scheme was demonstrated in a random number generator design, and the statistical randomness of the generated sequence was verified with the NIST test.