Research of phase correction technology based on interference pattern in FTIR: Research of phase correction technology based on interference pattern in FTIR
Chao Zhu, Changhua Lu, Wenqing Liu, Yujun Zhang, Xiaoting Chen, Kai Yang
{"title":"Research of phase correction technology based on interference pattern in FTIR: Research of phase correction technology based on interference pattern in FTIR","authors":"Chao Zhu, Changhua Lu, Wenqing Liu, Yujun Zhang, Xiaoting Chen, Kai Yang","doi":"10.3724/SP.J.1187.2013.00663","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":58398,"journal":{"name":"电子测量与仪器学报","volume":"140 1","pages":"663-668"},"PeriodicalIF":0.0000,"publicationDate":"2014-03-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"电子测量与仪器学报","FirstCategoryId":"1087","ListUrlMain":"https://doi.org/10.3724/SP.J.1187.2013.00663","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}