I. Fodchuk, S. Balovsyak, S. Novikov, I. Yanchuk, V. Romankevych
{"title":"Reconstruction of spatial distribution of strains in crystals using the energy spectrum of X-ray Moire patterns","authors":"I. Fodchuk, S. Balovsyak, S. Novikov, I. Yanchuk, V. Romankevych","doi":"10.3116/16091833/21/3/141/2020","DOIUrl":null,"url":null,"abstract":"We develop a new approach to the analysis of experimental Moiré patterns obtained with LLL-interferometer. Radial distributions of the energy spectra of Moiré patterns reveal different sensitivities to the sources of local mechanical strains in the lowand high-frequency ranges. This offers new possibilities for determining the magnitudes of total mechanical strains and reconstructing their spatial distributions in crystals.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.3116/16091833/21/3/141/2020","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 2
Abstract
We develop a new approach to the analysis of experimental Moiré patterns obtained with LLL-interferometer. Radial distributions of the energy spectra of Moiré patterns reveal different sensitivities to the sources of local mechanical strains in the lowand high-frequency ranges. This offers new possibilities for determining the magnitudes of total mechanical strains and reconstructing their spatial distributions in crystals.