Modification of the Ni-NiO-oxidant system by thermo-chemical oxidation with accelerated growth of the p-type dielectric oxide layer, by the action of substituted V2O5 on the system
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引用次数: 0
Abstract
Nickel is covered with very thin oxide film and is stable against corrosion under normal conditions. Nickel, as Ni-NiO-oxidant system, can make much thicker (even a thousand times) and more corrosion unstable oxides. With certain new oxidation process parameters, nickel can undergo so-called accelerated oxidation. The subject and goal of this work is to find the most favorable conditions for performing of accelerated - catastrophic Ni oxidation process, when substitution of V2O5 is carried out into NiO (2V (Ni)), with significant electron concentration increase and oxygen surplus. Unlimited main and secondary charge carriers transfer is significantly facilitated if oxide film with non-stoichiometric composition and defects is formed. The aim is to avoid compact oxide film formation by chemical-thermal treatments and to obtain porous and defective NiO. By using oxidized system Ni - NiO - oxidant in glass, ceramics and evaporated metal technology, extraordinary usable value of this work is ensured.
期刊介绍:
Science of Sintering is a unique journal in the field of science and technology of sintering.
Science of Sintering publishes papers on all aspects of theoretical and experimental studies, which can contribute to the better understanding of the behavior of powders and similar materials during consolidation processes. Emphasis is laid on those aspects of the science of materials that are concerned with the thermodynamics, kinetics and mechanism of sintering and related processes. In accordance with the significance of disperse materials for the sintering technology, papers dealing with the question of ultradisperse powders, tribochemical activation and catalysis are also published.
Science of Sintering journal is published four times a year.
Types of contribution: Original research papers, Review articles, Letters to Editor, Book reviews.